The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
May. 18, 2015
Amazon Technologies, Inc., Reno, NV (US);
Luis Felipe Cabrera, Bellevue, WA (US);
Eric Jason Brandwine, Haymarket, VA (US);
James R. Hamilton, Seattle, WA (US);
Jonathan A. Jenkins, Seattle, WA (US);
Matthew D. Klein, Seattle, WA (US);
Nathan Thomas, Seattle, WA (US);
Pradeep Vincent, Kenmore, WA (US);
AMAZON TECHNOLOGIES, INC., Seattle, WA (US);
Abstract
A set of techniques is described for monitoring and analyzing crashes and other malfunctions in a multi-tenant computing environment (e.g. cloud computing environment). The computing environment may host many applications that are executed on different computing resource combinations. The combinations may include varying types and versions of hardware or software resources. A monitoring service is deployed to gather statistical data about the failures occurring in the computing environment. The statistical data is then analyzed to identify abnormally high failure patterns. The failure patterns may be associated with particular computing resource combinations being used to execute particular types of applications. Based on these failure patterns, suggestions can be issued to a user to execute the application using a different computing resource combination. Alternatively, the failure patterns may be used to modify or update the various resources in order to correct the potential malfunctions caused by the resource.