The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Dec. 30, 2016
Applicant:

Western Digital Technologies, Inc., Irvine, CA (US);

Inventors:

Sanghoon Chu, San Jose, CA (US);

Scott Jinn, Diamond Bar, CA (US);

Yuriy Pavlenko, Mission Viejo, CA (US);

Kum-Jung Song, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G11C 29/00 (2006.01); G11C 29/44 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/076 (2013.01); G06F 11/0727 (2013.01); G11C 29/00 (2013.01); G11C 29/44 (2013.01); G11C 29/52 (2013.01); G06F 2201/81 (2013.01); G06F 2201/85 (2013.01); G06F 2201/88 (2013.01);
Abstract

The subject technology provides for managing a data storage system. A data operation error for a data operation initiated in a first non-volatile memory die of a plurality of non-volatile memory die in the data storage system is detected. An error count for an error type of the data operation error for the first non-volatile memory die is incremented. The incremented error count satisfies a first threshold value for the error type of the data operation error is determined. The first non-volatile memory die is marked for exclusion from subsequent data operations.


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