The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Sep. 30, 2016
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Amit Lieberman, Kefar Saba, IL;

Senya Touretski, Ramat Gan, IL;

Shai Harmelin, Haifa, IL;

Idan Levyl, Kadima-Zoran, IL;

Meytal Ashkenazy, Netanya, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/00 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/008 (2013.01); G06F 11/0709 (2013.01); G06F 11/0727 (2013.01); G06F 11/301 (2013.01);
Abstract

Detection of a cause of an error occurring in a data center is provided. A time period between a failure event in the data center and a previous successful event is determined. A set of devices involved in the failure event is generated using a data protection advisor (DPA). Data collected for the set of devices during the determined time period is scanned to detect at least one configuration change made during the determined time period. Based on a result of the scanned collected data, the at least one configuration change is displayed as a potential root cause of the error.


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