The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
May. 04, 2017
Applicants:
Stefan Wessling, Hannover, DE;
Nicklas Jeremias Ritzmann, Celle, DE;
Ulrike Peikert, Celle, DE;
Inventors:
Assignee:
BAKER HUGHES, A GE COMPANY, LLC, Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01); G01V 3/26 (2006.01); E21B 47/0228 (2012.01); E21B 47/026 (2006.01); E21B 7/04 (2006.01); E21B 44/00 (2006.01); E21B 47/00 (2012.01); E21B 49/00 (2006.01); G01V 3/30 (2006.01); G01V 11/00 (2006.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01); E21B 7/04 (2013.01); E21B 44/005 (2013.01); E21B 47/0002 (2013.01); E21B 49/00 (2013.01); E21B 49/003 (2013.01); G01V 3/26 (2013.01); G01V 3/30 (2013.01); G01V 11/00 (2013.01);
Abstract
A method for estimating an inverted parameter of a subsurface formation includes measuring a first parameter of the subsurface formation and measuring a second parameter of the subsurface formation. The method further includes defining one or more inversion constraints using the second parameter and inverting with a processor the first parameter to generate the inverted parameter of the subsurface formation using the one or more inversion constraints.