The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Mar. 21, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Kazuki Tani, Tokyo, JP;

Yoshinobu Kimura, Tokyo, JP;

Takashi Ogawa, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02M 7/5395 (2006.01); G01R 31/40 (2014.01); H02M 1/088 (2006.01); H02P 27/06 (2006.01); H02M 1/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/40 (2013.01); H02M 1/088 (2013.01); H02M 7/5395 (2013.01); H02M 2001/0009 (2013.01); H02P 27/06 (2013.01);
Abstract

A power converter is provided with a power semiconductor module having a switching element. The power converter includes a gate drive circuit, a first detection unit, a second detection unit, a time measuring unit, and an abnormality diagnostic unit. The gate drive circuit drives the switching element and outputs a feedback signal based on a switching operation of the switching element. The first detection unit detects a change in a feedback signal of an upper arm of the power converter. The second detection unit detects a change in a feedback signal of a lower arm of the power converter. The time measuring unit measures a difference between detection timings of a signal change by the first detection unit and a signal change by the second detection unit. The abnormality diagnostic unit performs diagnosis of the power converter based on a measurement result by the time measuring unit.


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