The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Feb. 25, 2016
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Daisuke Kirihara, Azumino, JP;
Masami Maeda, Suwa, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2891 (2013.01); G01R 31/2881 (2013.01); G01R 31/2862 (2013.01); G01R 31/2893 (2013.01);
Abstract
An inspection device includes: one chamber in which an IC device after an inspection can be arranged; another chamber in which the IC device after the inspection can be arranged and which is different from the one chamber; and a tray on which the electronic component after the inspection can be placed and which can move with the IC device from the one chamber to the another chamber. Also, the inspection device can detect at least one of humidity and temperature in the another chamber.