The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Aug. 09, 2016
Applicant:
Osaka University, Osaka, JP;
Inventors:
Shintarou Hisatake, Osaka, JP;
Tadao Nagatsuma, Osaka, JP;
Assignee:
OSAKA UNIVERSITY, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0885 (2013.01); G01R 29/08 (2013.01); G01R 29/0814 (2013.01); G01R 29/10 (2013.01);
Abstract
An electromagnetic field measurement device includes a first probe and a second probe arranged in a space to measure an electric field, a reference signal generator that generates a reference signal, a first multiplier that multiplies the reference signal by a signal obtained via the first probe, a second multiplier that multiplies a signal obtained via the second probe by the signal output from the first multiplier, and a synchronous detector that extracts a signal component that is synchronous with the reference signal from the signal output from the second multiplier.