The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Oct. 29, 2015
Applicant:

Life Technologies Corporation, Carlsbad, CA (US);

Inventors:

Todd Rearick, Cheshire, CT (US);

Mark Beauchemin, S. Glastonbury, CT (US);

Assignee:

Life Technologies Corporation, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G01N 27/414 (2006.01); G01N 27/27 (2006.01); C12Q 1/6869 (2018.01); G16B 30/00 (2019.01);
U.S. Cl.
CPC ...
G01N 27/4145 (2013.01); C12Q 1/6869 (2013.01); G01N 27/27 (2013.01); G01N 27/4148 (2013.01); G16B 30/00 (2019.02);
Abstract

A method is provided to sample a sensor array. The method can include measuring a waveform associated with a chemical event occurring on the sensor array. The waveform can include at least one region associated with expected measured values and at least one region associated with unpredictable measured values. The method can also include applying a first frame averaging to the at least one region associated with the expected measured values. Here, a first number of frames can be included in the first frame averaging. Further, the method can include applying a second frame averaging to the at least one region associated with the unpredictable measured values, where a second number of frames can be included in the second frame averaging. The second number of frames can be less than the first number of frames.


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