The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Mar. 22, 2016
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Guanghua Wang, Clifton Park, NY (US);

Danielle Marie Kalitan, Rexford, NY (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/00 (2006.01); G01K 7/02 (2006.01);
U.S. Cl.
CPC ...
G01N 25/00 (2013.01); G01K 7/02 (2013.01);
Abstract

A multi-function gas temperature measurement probe includes an outer casing, at least one high-temperature thermocouple inserted within the outer casing, at least one gas emissions sampling aperture defined within the outer casing, and at least one thin filament coupled to the outer casing. The at least one high-temperature thermocouple, the at least one gas emissions sampling aperture, and the at least one thin filament are proximate to each other.


Find Patent Forward Citations

Wang, Guanghua. (2019). Method and system for gas temperature measurement (U.S. Patent No. 10451573). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10451573

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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