The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Sep. 11, 2018
Fanuc Corporation, Yamanashi, JP;
Yuusuke Oota, Yamanashi, JP;
Fumikazu Warashina, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An inspection system makes image inspection on an inspection target. The inspection system includes: an image capture device that captures an image of the inspection target; a blower with a blow nozzle from which clean gas is blown out to the inspection target; a robot with an arm tip to which the image capture device and the blow nozzle, or the inspection target is attached; and as inspection device that makes image inspection on the inspection target based on an image captured by the image capture device. The inspection device generates an operation program for a robot based on the position of the image capture device and that of the blow nozzle relative to each other so as to move the blow nozzle ahead of the image capture device relative to the inspection target.