The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Jul. 31, 2017
Applicant:
Blackberry Limited, Waterloo, CA;
Inventors:
Michael Peter Montemurro, Toronto, CA;
Roland Emlyn Williams, San Ramon, CA (US);
James Randolph Winter Lepp, Ottawa, CA;
Stephen McCann, Southampton, GB;
Assignee:
BlackBerry Limited, Waterloo, Ontario, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G01M 17/013 (2006.01); G01M 17/02 (2006.01); G06K 9/00 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G01M 17/013 (2013.01); G01M 17/025 (2013.01); G06K 9/00798 (2013.01); H04L 67/12 (2013.01);
Abstract
A method for monitoring performance of at least one component on a moving platform, the method including receiving sensor data for the at least one component, along with supplemental data, at a processing node; and processing the sensor data, the processing using the supplemental data to filter the sensor data.
Quick Actions:
Montemurro, Michael. (2019). Method and system for sensor monitoring and analysis (U.S. Patent No. 10451526). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10451526
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile