The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Aug. 18, 2015
Seiko Instruments Inc., Chiba-shi, Chiba, JP;
Yoko Shinohara, Chiba, JP;
Masayuki Suda, Chiba, JP;
Manabu Oumi, Chiba, JP;
Takeshi Uchiyama, Chiba, JP;
Yoshiyuki Kaiho, Chiba, JP;
Ayako Nobe, Chiba, JP;
SEIKO INSTRUMENTS INC., , JP;
Abstract
A pressure change measuring apparatus and a pressure change measuring method are capable of detecting a change in pressure to be measured with respect to a time axis with high accuracy. The pressure change measuring apparatus includes a reference value setting unit that generates a reference value signal based on an output signal of a differential pressure measuring cantilever under a predetermined state and outputs the reference value signal. An arithmetic processing unit calculates the pressure change in the pressure to be measured based on the output signal, the reference value signal, a volume of a cavity, and a flowing quantity of a pressure transmission medium flowing into and out of the cavity for every unit of a predetermined time period.