The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Dec. 22, 2015
Applicant:

Sikorsky Aircraft Corporation, Stratford, CT (US);

Inventors:

Michael G. Mastrianni, Orange, CT (US);

Payman Sadegh, Alpharetta, GA (US);

Mark W. Davis, Southbury, CT (US);

John H. Judge, Woodbury, CT (US);

Assignee:

SIKORSKY AIRCRAFT CORPORATION, Stratford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01); G01L 1/26 (2006.01); G01B 11/16 (2006.01); B64D 45/00 (2006.01); G01B 5/30 (2006.01); G01M 11/08 (2006.01); B64C 25/00 (2006.01); G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
G01L 1/26 (2013.01); B64C 25/001 (2013.01); B64D 45/00 (2013.01); G01B 5/30 (2013.01); G01B 11/16 (2013.01); G01L 1/242 (2013.01); G01M 11/083 (2013.01); B64D 2045/008 (2013.01);
Abstract

A measuring system and method that computes and analyzes sensor data fused with multiple mechanical and thermally induced strain measurements is provided. Further, the measuring system and method realizes physics-based relations between sensor readings due to mechanical and thermal sources by optimally de-coupling a total strain into its mechanical and thermal components. The measuring system and method also auto-tunes coefficients involved in the optimal de-coupling equations using sensor specification data and previous system test results for initialization.


Find Patent Forward Citations

Loading…