The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Nov. 09, 2016
Applicant:

The Curators of the University of Missouri, Columbia, MO (US);

Inventor:

Zhi Xu, St. Louis, MO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/18 (2006.01); G01J 3/28 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/1804 (2013.01); G01J 3/28 (2013.01); G01J 3/2803 (2013.01); G01J 2003/123 (2013.01); G01J 2003/1239 (2013.01); G01J 2003/2866 (2013.01);
Abstract

Increased sensitivity of spectrometers through reducing noise in independent voltage signals via a differential voltage analyzer utilizing a reference wavelength from a wavelength region in which the optical absorption of the sample is negligible. In an embodiment, a grating permits selection of a reference wavelength. In another embodiment, filters permit selection of a reference wavelength. In yet another embodiment, both a grating and a filter permit selection of a reference wavelength. In an aspect, the differential voltage analyzer reduces noise by minimizing a differential voltage between the independent voltage signals and the reference voltage signal by adjusting the value of a cancellation coefficient.


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