The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

May. 16, 2013
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka-shi, Osaka, JP;

Inventors:

Fumikazu Shiba, Nara, JP;

Yuji Nakabayashi, Nara, JP;

Kouichi Takemura, Nara, JP;

Yuji Fujii, Nara, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 25/00 (2006.01); G01F 1/66 (2006.01); G01F 1/708 (2006.01); G01F 15/02 (2006.01);
U.S. Cl.
CPC ...
G01F 25/0007 (2013.01); G01F 1/667 (2013.01); G01F 1/668 (2013.01); G01F 1/7082 (2013.01); G01F 15/022 (2013.01);
Abstract

A flow rate measurement device of the present invention includes a flow rate signal detection unit for detecting a flow rate signal of a fluid to be measured flowing through flow path, flow rate calculation unit for calculating a flow rate from the flow rate signal detected by the flow rate signal detection unit, and oscillation circuit for generating a reference clock. Furthermore, the flow rate measurement device includes temperature calculation unit for calculating a temperature from a frequency change resulting from a temperature change of oscillation circuit, and flow rate correction unit for correcting the flow rate calculated by the flow rate calculation unit by obtaining an offset flow rate at a desired temperature based on the temperature calculated by temperature calculation unit. Thus, accuracy of flow rate measurement can be improved.


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