The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Feb. 20, 2013
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Lorenz-Peter Schmidt, Hessdorf, DE;
Marcus Schramm, Strullendorf, DE;
Michael Hrobak, Numberg, DE;
Jan Schür, Forchheim, DE;
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Abstract
A method and a system for calibrating a measuring arrangement on the basis of a 16-term error model determines a matrix (A) with measured scattering parameters (S) from different calibration standards () and with associated actual scattering parameters (S) of the calibration standards () and determines linear-in-T system errors (T) for the calibration of a network analyzer () by solving a linear equation system with the determined matrix (A). To solve the linear equation system, a first and a second linear-in-T system error (k, p) are freely selected in each case. With use of reciprocal calibration standards, the determined linear-in-T system errors are weighted with the freely selected first linear-in-T system error (T) or with a correct second linear-in-T system error p(k)) dependent upon the first linear-in-T system error (k).