The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Nov. 23, 2015
Applicant:
The Boeing Company, Huntington Beach, CA (US);
Inventors:
Anthony W. Baker, Gilbertsville, PA (US);
Christopher Bellavia, St. Louis, MO (US);
Assignee:
THE BOEING COMPANY, Chicago, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/40 (2006.01); G06K 9/26 (2006.01); G01B 11/24 (2006.01); G01B 11/14 (2006.01); G06T 7/00 (2017.01); G01N 21/88 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/14 (2013.01); G01N 21/8851 (2013.01); G01N 21/9515 (2013.01); G06T 7/001 (2013.01); G01N 2021/8883 (2013.01); G01N 2201/10 (2013.01); G01N 2201/12 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20056 (2013.01);
Abstract
A method of analyzing a curved surface is provided. The method includes obtaining a first data point set including data points representative of a distance between points along the curved surface and a reference axis, determining outlier data points in the first data point set, extracting the outlier data points from the first data point set, thereby defining a second data point set. The method also includes determining a fitted curve for the second data point set, wherein the fitted curve defines an approximate true curve of the curved surface.