The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Jan. 28, 2015
Applicant:

Jabil Optics Germany Gmbh, Jena, DE;

Inventors:

Eberhard Piehler, Lehesten OT Nerkewitz, DE;

Theresa Kunz, Jena, DE;

Gertrud Blei, Jena, DE;

Rainer Fischer, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 3/00 (2006.01); F21V 5/00 (2018.01);
U.S. Cl.
CPC ...
F21V 5/004 (2013.01); G02B 3/00 (2013.01);
Abstract

The invention relates to a microlens arrangement () and an illumination device () for uniformly illuminating of an area (F), with a light source () and a microlens arrangement (). In order to illuminate the area (F) to be illuminated as homogeneously as possible, the at least one microlens () of the microlens arrangement () has an entrance face () which is shaped such that monochromatic light incident on the microlens () and propagating parallel to the optical axis (O) is refracted by the entrance face () such that back focal lengths (S, S, S) of the light with the optical axis (O) increase with the height of incidence (E, E, E).


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