The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Apr. 04, 2016
Applicant:

Sercel-grc Corp, Tulsa, OK (US);

Inventors:

Anthony Thornberry, Tulsa, OK (US);

John Ainslie, Tulsa, OK (US);

David Covington, Tulsa, OK (US);

Assignee:

SERCEL-GRC CORP., Tulsa, OK (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 47/06 (2012.01); E21B 49/08 (2006.01); G01V 11/00 (2006.01); E21B 47/12 (2012.01);
U.S. Cl.
CPC ...
E21B 47/065 (2013.01); E21B 47/06 (2013.01); E21B 47/12 (2013.01); E21B 47/122 (2013.01); E21B 49/08 (2013.01); G01V 11/002 (2013.01); E21B 2049/085 (2013.01);
Abstract

System and method for measuring a parameter within a well. The method includes connecting a gauge to a first end of a cable and connecting a vector network analyzer to a second end of the cable, lowering the gauge inside the well, generating a signal with the vector network analyzer and sending the signal along the cable to the gauge, sweeping a frequency of the signal within a given range while feeding the signal to the gauge, determining a resonance frequency of at least one sensor located within the gauge, and calculating the parameter from the resonance frequency of the at least one sensor.


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