The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Feb. 23, 2016
Tokai Kogyo Mishin Kabushiki Kaisha, Kasugai, JP;
Nsd Corporation, Nagoya-shi, JP;
Isao Ohashi, Komaki, JP;
Koichi Nakamura, Komaki, JP;
Yoshichika Takizawa, Kasugai, JP;
Masayoshi Ono, Tokai, JP;
Hirotsugu Uenishi, Chiryu, JP;
TOKAI KOGYO MISHIN KABUSHIKI KAISHA, Kasugai-Shi, JP;
NSD CORPORATION, Nagoya-Shi, JP;
Abstract
Disclosed is a sewing machine which evaluates sewing quality using a stitch tightness index. During sewing operation, a used length of an upper thread per stitch is detected, and a stitch tightness index per sewn stitch is calculated on the basis of a stitch length per stitch defined by sewing pattern data, a fabric thickness of a sewing workpiece, and detected data of the used length of the upper thread. Then, notification is made which corresponds to the calculated stitch tightness index per sewn stitch (such as a visual display of the stitch tightness index). After that, acceptability/non-acceptability of the thread tightness per sewn stitch can be determined by comparing the calculated stitch tightness index per sewn stitch against a reference value, and a result of the determination can be notified.