The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2019

Filed:

Jan. 05, 2019
Applicant:

Toppan Printing Co., Ltd., Tokyo, JP;

Inventor:

Tomoya Sumida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61M 37/00 (2006.01); A61M 5/42 (2006.01);
U.S. Cl.
CPC ...
A61M 37/0015 (2013.01); A61M 5/42 (2013.01); A61M 37/00 (2013.01); A61M 2037/0023 (2013.01); A61M 2037/0061 (2013.01);
Abstract

A microneedle puncture instrument includes a pinch section including a first pinch element and a second pinch element arrayed in an array direction and configured to individually pinch the skin in a pinch direction, which intersects with the array direction, the first pinch element and the second pinch element being connected to each other with a distance therebetween maintained within a predetermined range; and a puncture section configured to puncture the skin while pinching the skin in the pinch direction at a position between the first pinch element and the second pinch element in the array direction, the puncture section including a microneedle for puncturing the skin and a support portion that supports the microneedle.


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