The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Jun. 27, 2017
General Electric Company, Schenectady, NY (US);
Bruno Kristiaan Bernard De Man, Clifton Park, NY (US);
Jed Douglas Pack, Glenville, NY (US);
Eri Haneda, Niskayuna, NY (US);
Sathish Ramani, Niskayuna, NY (US);
Jiang Hsieh, Brookfield, WI (US);
James Vradenburg Miller, Clifton Park, NY (US);
Peter Michael Edic, Albany, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for characterizing anatomical features includes receiving scanned data and image data corresponding to a subject. The scanned data comprises sinogram data. The method further includes identifying a first region in an image of the image data corresponding to a region of interest. The method also includes determining a second region in the scanned data. The second region corresponds to the first region. The method further includes identifying a sinogram trace corresponding to the region of interest. The sinogram trace comprises sinogram data present within the second region. The method includes determining a data feature of the subject based on the sinogram trace and a deep learning network. The method also includes determining a diagnostic condition corresponding to a medical condition of the subject based on the data feature.