The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2019
Filed:
Feb. 28, 2017
Koninklijke Philips N.v., Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The invention relates to a combined imaging detector () for the detection of x-ray and gamma quanta. The combined imaging detector () is adapted for simultaneous detection of gamma and x-ray quanta. The combined imaging detector () includes an x-ray anti-scatter grid (), a layer of x-ray scintillator elements (), a first photodetector array (), a layer of gamma scintillator elements (), and a second photodetector array () that are arranged in a stacked configuration along a radiation-receiving direction (). The x-ray anti-scatter grid () comprises a plurality of septa () that define a plurality of apertures () which are configured to collimate both x-ray quanta and gamma quanta received from the radiation receiving direction () such that received gamma quanta are collimated only by the x-ray anti-scatter grid (). The use of the x-ray anti-scatter grid as a collimator for received gamma quanta results in a significantly lighter combined imaging detector.