The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Oct. 23, 2018
Applicant:

Sharp Kabushiki Kaisha, Sakai, Osaka, JP;

Inventors:

Kazuhiro Mizude, Sakai, JP;

Kazuma Ogawa, Sakai, JP;

Tatsuya Fujisaki, Sakai, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); H04N 1/38 (2006.01); H04N 1/387 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00816 (2013.01); H04N 1/00708 (2013.01); H04N 1/38 (2013.01); H04N 1/3873 (2013.01); H04N 2201/0081 (2013.01); H04N 2201/0094 (2013.01);
Abstract

An image reading apparatus including: an original reading circuit configured to scan at least one original placed on an original table and read an image of the original; an original size detector configured to detect a size of an original to be scanned before the scan; and a control circuit configured to determine as a reading-area an area from which an image is to be read by the original reading circuit by referring to the original size detected by the original size detector, wherein the control circuit is configured to initiate a multi-crop process in which the original reading circuit scans a plurality of originals placed on the original table in batch as a batch-scan and crops an image of each of the originals, and to determine the reading-area based on a width of a maximum original in a main scanning direction and a length of a maximum original in a sub-scanning direction regardless of the detection of the original size detector when initiating the multi-crop process.


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