The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Apr. 27, 2018
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Tianyu Tang, Milpitas, CA (US);

Venkatesh Ramachandra, San Jose, CA (US);

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/017 (2006.01); G11C 7/22 (2006.01);
U.S. Cl.
CPC ...
H03K 3/017 (2013.01); G11C 7/222 (2013.01);
Abstract

A duty cycle correction system corrects for duty cycle distortion by measuring average time interval durations of consecutive intervals of an input signal. The system generates complementary ramp signals that have cross-points indicating midpoints of the intervals, and detects those cross-points. An output circuit of the duty cycle correction system generates an output signal that performs rising and falling transitions in response to the detected cross-points.


Find Patent Forward Citations

Tang, Tianyu. (2019). Duty cycle correction on an interval-by-interval basis (U.S. Patent No. 10447247). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10447247

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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