The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Dec. 14, 2016
Applicant:

Raytheon Company, Waltham, MA (US);

Inventor:

James A. Pruett, Allen, TX (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/42 (2006.01); H01Q 21/30 (2006.01); H01Q 5/30 (2015.01); H01Q 3/22 (2006.01); G01S 13/02 (2006.01);
U.S. Cl.
CPC ...
H01Q 21/30 (2013.01); G01S 13/426 (2013.01); H01Q 3/22 (2013.01); H01Q 5/30 (2015.01); G01S 2013/0254 (2013.01);
Abstract

Systems and methods described herein are directed towards a radar system and a dual frequency electronically scanned array (ESA) capable of transmitting and receiving radio frequency (RF) signals at least two frequencies. The ESA includes a plurality of antenna elements which form a first effective aperture at a first radio frequency (RF) frequency and operational over a first scan range and which form a second effective aperture at a second radio frequency (RF) frequency and operational over a second scan angle. The first and second scan ranges are complementary so as to provide the radar system having an overall scan range. The plurality of antenna elements are spaced apart from each other by an amount related to at least one of the first and second scan ranges and/or one or more operating frequencies of the radar system.


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