The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Apr. 28, 2016
Applicant:

Mitsui Mining & Smelting Co., Ltd., Tokyo, JP;

Inventors:

Tetsuya Mitsumoto, Takehara, JP;

Kyohei Yamaguchi, Takehara, JP;

Toshikazu Matsuyama, Takehara, JP;

Hideaki Matsushima, Takehara, JP;

Shinya Kagei, Takehara, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/505 (2010.01); H01M 4/525 (2010.01); H01M 10/0525 (2010.01); C01G 53/00 (2006.01); C01G 49/00 (2006.01); C01G 51/00 (2006.01); H01M 4/02 (2006.01); H01M 10/052 (2010.01);
U.S. Cl.
CPC ...
H01M 4/505 (2013.01); C01G 49/009 (2013.01); C01G 51/54 (2013.01); C01G 53/54 (2013.01); C01G 53/70 (2013.01); H01M 4/525 (2013.01); H01M 10/0525 (2013.01); C01P 2002/01 (2013.01); C01P 2002/32 (2013.01); C01P 2002/50 (2013.01); C01P 2002/60 (2013.01); C01P 2002/76 (2013.01); C01P 2004/62 (2013.01); C01P 2006/11 (2013.01); C01P 2006/12 (2013.01); C01P 2006/80 (2013.01); C01P 2006/82 (2013.01); H01M 10/052 (2013.01); H01M 2004/028 (2013.01);
Abstract

Provided is a new 5 V class spinel-type lithium manganese-containing composite oxide which enables the expansion of a high potential capacity region and the suppression of gas generation. The 5 V class spinel-type lithium manganese-containing composite oxide has an operating potential of 4.5 V or more at a metal Li reference potential, and contains Li, Mn, O and two or more other elements. The spinel-type lithium manganese-containing composite oxide is characterized in that, in an electronic diffraction image from a transmission electron microscope (TEM), a diffraction spot observed in the Fd-3m structure as well as a diffraction spot not observed in the Fd-3m structure are confirmed.


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