The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Mar. 05, 2018
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Hyangmi Jung, Yokohama, JP;

Yuko Nomura, Kawasaki, JP;

Satomi Taguchi, Ota, JP;

Assignee:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/18 (2006.01); H01L 51/42 (2006.01); H01L 51/00 (2006.01); B82Y 15/00 (2011.01);
U.S. Cl.
CPC ...
H01L 51/4253 (2013.01); H01L 51/0047 (2013.01); H01L 51/0077 (2013.01); B82Y 15/00 (2013.01);
Abstract

According to one embodiment, a radiation detector includes first, and second conductive layers, and an organic layer. The organic layer is provided between the first and second conductive layers. A first thickness of the organic layer along a first direction from the second conductive layer toward the first conductive layer is 1 μm or more. The organic layer includes a first compound of a first conductivity type, and a second compound of a second conductivity type. A first value of (0.9·λ)/(w·cos θ) for a first peak of X-ray analysis of the organic layer is not less than 13 nm and not more than 19 nm. The first value is obtained from a first Bragg angle θ(radians), a first full width at half maximum w(radians) of the 2θpeak, and an X-ray wavelength λ (nm). The 2θis not less than 0.0750 radians and not more than 0.1100 radians.


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