The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Apr. 07, 2017
Applicant:

United Silicon Carbide, Inc., Monmouth Junction, NJ (US);

Inventors:

Anup Bhalla, Princeton Junction, NJ (US);

Zhongda Li, Somerset, NJ (US);

Assignee:

United Silicone Carbide, Inc., Monmouth Junction, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/16 (2006.01); H01L 29/10 (2006.01); H01L 29/66 (2006.01); H01L 29/06 (2006.01); H01L 29/808 (2006.01); H01L 29/08 (2006.01); H01L 29/423 (2006.01); H01L 21/04 (2006.01); H01L 29/20 (2006.01); H01L 29/36 (2006.01);
U.S. Cl.
CPC ...
H01L 29/8083 (2013.01); H01L 21/0465 (2013.01); H01L 29/0843 (2013.01); H01L 29/1058 (2013.01); H01L 29/1066 (2013.01); H01L 29/1095 (2013.01); H01L 29/1608 (2013.01); H01L 29/2003 (2013.01); H01L 29/42316 (2013.01); H01L 29/66068 (2013.01); H01L 29/66909 (2013.01); H01L 29/0619 (2013.01); H01L 29/0692 (2013.01); H01L 29/36 (2013.01);
Abstract

A JFET having vertical and horizontal channel elements may be made from a semiconductor material such as silicon carbide using a first mask for multiple implantations to form a horizontal planar JFET region comprising a lower gate, a horizontal channel, and an upper gate, all above a drift region resting on a drain substrate region, such that the gates and horizontal channel are self-aligned with the same outer size and outer shape in plan view. A second mask may be used to create a vertical channel region abutting the horizontal channel region. The horizontal channel and vertical channel may each have multiple layers with varying doping concentrations. Angled implantations may use through the first mask to implant portions of the vertical channel regions. The window of the second mask may partially overlap the horizontal JFET region to insure abutment of the vertical and horizontal channel regions.


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