The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Nov. 25, 2014
Applicants:

Tohoku University, Sendai-shi, Miyagi, JP;

Zeon Corporation, Tokyo, JP;

Inventors:

Tetsuya Goto, Sendai, JP;

Makoto Takeshita, Tokyo, JP;

Assignees:

TOHOKU UNIVERSITY, Sendai-shi, Miyagi, JP;

ZEON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/786 (2006.01); C08F 2/06 (2006.01); H01L 21/02 (2006.01); H01L 29/66 (2006.01); C08F 283/14 (2006.01); C08L 65/00 (2006.01); C08G 61/02 (2006.01); H01L 23/29 (2006.01); H01L 23/31 (2006.01); C08K 5/5425 (2006.01); C08L 33/08 (2006.01); C08F 220/10 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7869 (2013.01); C08F 2/06 (2013.01); C08F 283/14 (2013.01); C08G 61/02 (2013.01); C08K 5/5425 (2013.01); C08L 33/08 (2013.01); C08L 65/00 (2013.01); H01L 21/02118 (2013.01); H01L 21/02123 (2013.01); H01L 21/02318 (2013.01); H01L 21/02565 (2013.01); H01L 23/293 (2013.01); H01L 23/3171 (2013.01); H01L 29/66969 (2013.01); C08F 220/10 (2013.01); C08G 2261/122 (2013.01); C08G 2261/143 (2013.01); C08G 2261/1426 (2013.01); C08G 2261/3325 (2013.01); C08G 2261/418 (2013.01); C08G 2261/724 (2013.01); C08G 2261/77 (2013.01); C08G 2261/92 (2013.01); H01L 2224/05 (2013.01);
Abstract

A method of production of a semiconductor device comprising a semiconductor layer forming step of forming a semiconductor layer including an inorganic oxide semiconductor on a board, a passivation film forming step of forming a passivation film comprising an organic material so as to cover the semiconductor layer, a baking step of baking the passivation film, and a cooling step of cooling the passivation film after baking, herein, in the cooling step, a cooling speed from a baking temperature at the time of baking in the baking step to a temperature 50° C. lower than the baking temperature is substantially controlled to 0.5 to 5° C./min in range is provided.


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