The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

May. 22, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Ser Nam Lim, Schenectady, NY (US);

Xiao Bian, Niskayuna, NY (US);

David Scott Diwinsky, West Chester, OH (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 7/00 (2017.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); G06K 9/00201 (2013.01); G06K 9/4628 (2013.01); G06K 9/6271 (2013.01); G06T 7/97 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A method includes obtaining a series of images of a rotating target object through multiple revolutions of the target object. The method includes grouping the images into multiple, different sets of images. The images in each of the different sets depict a common portion of the target object. At least some of the images in each set are obtained during a different revolution of the target object. The method further includes examining the images in at least a first set of the multiple sets of images using an artificial neural network for automated object-of-interest recognition by the artificial neural network.


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Lim, Ser. (2019). Image analysis neural network systems (U.S. Patent No. 10445871). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10445871

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