The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

May. 25, 2016
Applicants:

Jamey Graham, San Jose, CA (US);

Michael Griffin, Redwood City, CA (US);

Tiffany Romain, Oakland, CA (US);

Daniel G Van Olst, Menlo Partk, CA (US);

Inventors:

Jamey Graham, San Jose, CA (US);

Michael Griffin, Redwood City, CA (US);

Tiffany Romain, Oakland, CA (US);

Daniel G Van Olst, Menlo Partk, CA (US);

Assignee:

Ricoh Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 30/00 (2012.01); G06Q 30/06 (2012.01); G06Q 10/08 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/0643 (2013.01); G06Q 10/087 (2013.01);
Abstract

The disclosure includes a system and method for aligning a realogram and a planogram. An alignment module of an image recognition application receives a realogram, the realogram including information about product recognitions, and a planogram corresponding to the realogram. The alignment module also generates a planogram brand chunk in the planogram, the planogram brand chunk grouping a plurality of planogram product facings belonging to a same brand, and a realogram brand chunk in the realogram based on the planogram brand chunk. The alignment module additionally identifies a planogram product facing in the planogram brand chunk and a realogram product facing in the realogram brand chunk and aligns the planogram product facing with the realogram product facing.


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