The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Nov. 23, 2015
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Jianfeng Gao, Woodinville, WA (US);

Li Deng, Redmond, WA (US);

Xiaodong He, Sammamish, WA (US);

Lin Xiao, Bellevue, WA (US);

Xinying Song, Bellevue, WA (US);

Yelong Shen, Bothell, WA (US);

Ji He, Jiangsu, CN;

Jianshu Chen, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01);
Abstract

A processing unit can successively operate layers of a multilayer computational graph (MCG) according to a forward computational order to determine a topic value associated with a document based at least in part on content values associated with the document. The processing unit can successively determine, according to a reverse computational order, layer-specific deviation values associated with the layers based at least in part on the topic value, the content values, and a characteristic value associated with the document. The processing unit can determine a model adjustment value based at least in part on the layer-specific deviation values. The processing unit can modify at least one parameter associated with the MCG based at least in part on the model adjustment value. The MCG can be operated to provide a result characteristic value associated with test content values of a test document.


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