The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
May. 06, 2016
Sony Corporation, Tokyo, JP;
Tomonori Tsutsumi, Tokyo, JP;
Takafumi Morifuji, Tokyo, JP;
SONY CORPORATION, Tokyo, JP;
Abstract
The present disclosure relates to an image processing apparatus and method capable of reproducing a material feel just like a real thing is there. A reflection characteristic estimation unit estimates and analyzes, from a supplied input image, a reflection characteristic of the subject as a characteristic of a subject. The reflection characteristic estimation unit supplies a specular reflection component as a reflection characteristic estimation result to a characteristic information integrating unit and a highlight area detection unit as an image estimation information. The highlight area detection unit performs highlight area detection in parallel to processing with the reflection characteristic estimation unit by using the specular reflection component as the reflection characteristic estimation result from the reflection characteristic estimation unit, and supplies the highlight area detection result to a characteristic information integrating unit as the image estimation information. The present disclosure is applicable to an image processing apparatus, for example.