The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Jan. 25, 2017
Honeywell International Inc., Morris Plains, NJ (US);
David Sandquist, Saint Paul, MN (US);
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A system for performing real-time variance analysis of data measurements comprises a data source, and a data processing unit in operative communication with the data source. The data processing unit is configured to receive data measurement values output from the data source and comprises a processer, and a memory device that includes instructions executable by the processor for a real-time algorithm that performs variance calculations for the data measurement values. The real-time algorithm performs a process comprising: initializing a data array for tracking a variance of individual data measurement values received from the data source; receiving a data measurement value from the data source; determining the number of averaging times to be recalculated; and repeating the process when the next data measurement value is received from the data source. The data processing unit is configured to output real-time variance measurements based on the variance calculations for the data measurement values.