The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Dec. 29, 2014
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Nalinkumar Mistry, Ottawa, CA;

Stephen Todd, Shrewsbury, MA (US);

Mats Wahlstrom, Lakewood Ranch, FL (US);

David Frattura, New York, NY (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 16/27 (2019.01); H04L 12/917 (2013.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 16/27 (2019.01); H04L 43/08 (2013.01); H04L 47/76 (2013.01);
Abstract

Distributed nodes are implemented using virtualization infrastructure of at least one processing platform. The processing platform is implemented using at least one processing device comprising a processor coupled to a memory. The distributed nodes collectively provide at least a portion of a distributed contextual analytics framework comprising analytics functions deployed at respective ones of the nodes. For example, the distributed nodes illustratively comprise multiple local nodes and at least one central node, with the distributed contextual analytics framework comprising local analytics functions deployed at respective ones of the local nodes and a central analytics function deployed at the central node.


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