The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Feb. 29, 2016
Applicant:

Schweitzer Engineering Laboratories, Inc., Pullman, WA (US);

Inventors:

Carl V. Mattoon, Austin, TX (US);

Travis L. Mooney, Pullman, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
G06F 11/00 (2013.01); G01R 19/2513 (2013.01);
Abstract

The present disclosure pertains correcting linear interpolation errors. In one embodiment, a system comprises an input configured to receive the periodic signal at a first sampling rate and an output configured to provide an interpolated representation of the periodic signal at a second sampling rate. A linear interpolation subsystem may establish a ratio between the first sampling rate and the second sampling rate to determine a slip frequency. The linear interpolation subsystem creates an interpolated representation of the periodic signal based on the ratio. The interpolated representation of the periodic signal includes a deterministic error attributable to interpolation. A linear interpolation correction subsystem may correct the deterministic error attributable to the linear interpolation subsystem and create a corrected interpolated representation. An application interface subsystem may provide the corrected interpolated representation to an application.


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