The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
May. 22, 2018
Institute for Information Industry, Taipei, TW;
Cheng-Juei Yu, New Taipei, TW;
Yi-Hsin Wu, New Taipei, TW;
Yin-Jing Tien, Taipei, TW;
Huan-Chi Peng, New Taipei, TW;
Yu-Xuan Su, New Taipei, TW;
Li-Jung Chen, Taipei, TW;
Institute For Information Industry, Taipei, TW;
Abstract
An apparatus and a method thereof for determining a control condition set of a production line. The apparatus divides several historical control condition sets into several groups, wherein the historical control conditions corresponding to the same control factor are the same in each group. For each group, the apparatus calculates a measurement of central tendency according to the historical yield related values in the group. The apparatus decides a subset of the groups. For each group in the subset, the apparatus calculates a degree of variation and a number regarding the different control conditions between the control condition set and the group. The apparatus calculates weight scores. Based on the measurements of central tendency and the weight scores, the apparatus selects one of the groups as a selected group and assigns the historical control conditions of the selected group as the control conditions of the control condition set.