The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Feb. 15, 2018
Applicant:

Hoya Corporation, Shinjuku-ku, Tokyo, JP;

Inventors:

Atsushi Matsumoto, Tokyo, JP;

Hiroaki Shishido, Tokyo, JP;

Takashi Uchida, Tokyo, JP;

Assignee:

HOYA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/32 (2012.01); G03F 1/58 (2012.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03F 1/32 (2013.01); G03F 1/58 (2013.01); G03F 7/2053 (2013.01);
Abstract

To provide a phase-shift mask in which the reduction in thickness of a light-shielding film is provided when a transition metal silicide-based material is used for the light-shielding film and by which the problem of ArF light fastness can be solved; and a mask blank for manufacturing the phase-shift mask. A mask blank has a structure in which a phase-shift film, an etching stopper film, a light-shielding film, and a hard mask film are laminated in said order on a transparent substrate, and at least one layer in the light-shielding film is made of a material which contains transition metal and silicon, and satisfies the conditions of Formula (1) below:≤9.0×10−1.65×10−7.718×10+3.611×−21.084   Formula () wherein Ris a ratio of the content of transition metal to the total content of transition metal and silicon in said one layer, and Cis the content of nitrogen in said one layer.


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