The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Jun. 07, 2018
Applicant:

Samsung Display Co., Ltd., Yongin-si, Gyeonggi-do, KR;

Inventor:

Kyong-Tae Park, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/13 (2006.01); H01L 21/66 (2006.01); G01R 31/28 (2006.01); H01L 27/12 (2006.01); H01L 27/32 (2006.01); G09G 3/00 (2006.01); G09G 3/3233 (2016.01); H05B 33/08 (2006.01); G01R 31/44 (2006.01);
U.S. Cl.
CPC ...
G02F 1/1309 (2013.01); G01R 31/2841 (2013.01); G01R 31/44 (2013.01); G09G 3/006 (2013.01); H01L 22/30 (2013.01); H01L 27/1244 (2013.01); H01L 27/3276 (2013.01); H05B 33/086 (2013.01); H05B 33/0887 (2013.01); H05B 33/0896 (2013.01); G09G 3/3233 (2013.01); G09G 2300/0413 (2013.01); G09G 2330/04 (2013.01); G09G 2330/08 (2013.01); G09G 2330/10 (2013.01); G09G 2330/12 (2013.01); Y02B 20/341 (2013.01);
Abstract

A display device includes a substrate, one line on the substrate, the one line extending from a peripheral region through a display region, pixels on the display region, the pixels being connected to the one line, an outer line on the peripheral region, the outer line being connected to the one line during a short circuit test process that detects a position of a short circuit defect, an electrostatic protection resistor on the peripheral region, the electrostatic protection resistor being connected to the outer line, a pad on the peripheral region, the pad being connected to the outer line through the electrostatic protection resistor, a short circuit test signal being applied to the pad during the short circuit test process, and a bypass line connecting a node between the pad and the electrostatic protection resistor to the outer line.


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