The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Jan. 09, 2018
Facebook Technologies, Llc, Menlo Park, CA (US);
Daozhi Wang, Dublin, CA (US);
Ning Yeung Chan, Palo Alto, CA (US);
Youngshik Yoon, Cupertino, CA (US);
Shizhe Shen, San Mateo, CA (US);
Torin Ross Herndon, Palo Alto, CA (US);
Facebook Technologies, LLC, Menlo Park, CA (US);
Abstract
An optical characterization system tests optical elements of head-mounted displays (HMD) such as lenses. The system emits a test pattern of light through an aperture of a hollow truncated cone. The hollow truncated cone may be rotated to different angles of test positions, for example, to mimic rotation of a human eye of a user wearing an HMD. The emitted light is refracted by a test lens and captured by a detector assembly. Using images captured by the detector assembly, the system determines one or more quality metrics of the test lens. Quality metrics may describe various types of optical aberrations, which may be determined as a function of the test positions (e.g., angle and/or position of the hollow truncated cone relative to the test lens). In addition, the system may generate an optical profile of the test lens using the quality metrics.