The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Jan. 13, 2015
Applicant:
Raytheon Company, Waltham, MA (US);
Inventor:
Matthew A. Schaefer, Rowlett, TX (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2006.01); G06T 7/30 (2017.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G06T 5/50 (2013.01); G06T 7/30 (2017.01); G06T 2207/10028 (2013.01);
Abstract
Systems and processes for increasing the effective sampling density of a LADAR data set are disclosed. LADAR data points are merged with data regarding edges of objects within the physical space represented by the LADAR data points to form a merged LADAR-edge point cloud. Each data point within the merged LADAR-edge point cloud is examined to identify co-planar neighboring data points within a defined search area. Additional data points are added to the LADAR-edge point cloud by interpolating between the identified, co-planar neighboring data points.