The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Oct. 06, 2016
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Koichi Tezuka, Kobe, JP;

Koichi Iida, Kobe, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/00 (2006.01); G01S 17/08 (2006.01); G01S 7/491 (2006.01);
U.S. Cl.
CPC ...
G01S 17/08 (2013.01); G01S 7/4911 (2013.01);
Abstract

A distance measuring apparatus includes a projector configured to project laser beam at a projection angle to an object; a photodetector array in which a plurality of photodetectors are arranged; a condenser lens configured to concentrate, on the photodetector array, the laser beam reflected by the object positioned on a direction of the projection angle; a detector configured to detect an output of at least one of the photodetectors of the photodetector array; and a selector configured to select the photodetector from which the detector receives the output, depending on a distortion of an area on the photodetector array irradiated with the reflected laser beam when the projection angle is large, the area being determined by an angle of incidence of the reflected laser beam to the condenser lens, the angle of incidence being associated with the projection angle.


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