The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Oct. 02, 2015
Applicant:

Megin Oy, Helsinki, FI;

Inventors:

Antti Ahonen, Helsinki, FI;

Rob Blaauwgeers, Kauniainen, FI;

Pasi Petteri Laine, Helsinki, FI;

Sami Antero Lähteenmäki, Espoo, FI;

Assignee:

Megin Oy, Helsinki, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F17C 3/08 (2006.01); G01R 33/035 (2006.01); A61B 5/04 (2006.01); F25B 9/10 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0354 (2013.01); A61B 5/04008 (2013.01); F17C 3/085 (2013.01); F25B 9/10 (2013.01); A61B 2560/0242 (2013.01); A61B 2560/0247 (2013.01); A61B 2576/026 (2013.01); F17C 2250/0673 (2013.01); F17C 2265/034 (2013.01); F17C 2270/0536 (2013.01); F25B 2400/17 (2013.01);
Abstract

The invention relates to a method and a magnetoencephalography (MEG) measurement device. In the method there is determined the ending of a scheduled inactivity period of the MEG device. At the ending of the inactivity period a cryocooler of the MEG device is switched off. Helium is allowed to boil in the Dewar vessel of the MEG device when the MEG device is active and used to perform patient measurements. The boiled helium is collected via a compressor to an external storage tank. When a new inactivity period for the MEG device commences, the cryocooler is started anew and helium is let from the external storage tank in-to the Dewar vessel, where it is re-liquefied by the cryocooler. The compressor may be switched off when the cryocooler is switched on.


Find Patent Forward Citations

Loading…