The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Aug. 27, 2018
Power Probe Tek, Llc, Brea, CA (US);
David Barden, Placentia, CA (US);
Joshua Carton, Wilmington, CA (US);
Wayne Russell, Ontario, CA (US);
Power Probe Tek, LLC, Brea, CA (US);
Abstract
An apparatus is provided for a diagnostic circuit test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof in powered and unpowered states. The diagnostic circuit test device comprises a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto. A power supply is interconnected between an internal power source and the conductive probe element. Processors are electrically connected to the conductive probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal. The output signal is representative of at least one of the parameters of the electrical system. A display device is configured to display a reading of the output signal which is representative of the parameter.