The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Dec. 10, 2015
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Yoshiaki Maeda, Kyoto, JP;
Yoshihiro Hayakawa, Ibaraki, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
An analyzer control systemfor monitoring and controlling an analyzerincludes: a plurality of sensors for detecting the condition of each component of the analyzer; a potential problem inference sectionfor receiving detection results obtained with all or part of the sensors and for inferring whether or not the analyzer is in a potentially problematic condition; and a potential problem display sectionfor showing, on a display screen, information on the potentially problematic condition. The 'potentially problematic condition' is neither a condition in which the analysis data being collected by the analyzer are unusable, nor a condition which requires deactivation of the analyzer; it is a condition in which the analyzing operation may be continued for the time being, although the analyzer is likely to soon fall into the aforementioned situations if the operation is further continued. The already collected data can be properly used.