The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
May. 04, 2017
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Katsuyuki Taneda, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
Peaks are detected on a mass chromatogram at multiple m/z ratios characterizing a target component, and the detected peaks are classified into groups according to their occurrence time. The measured mass spectrum is acquired for each group, the measured mass spectrum and standard mass spectrum of the target component are matched for each m/z, and the standard mass spectrum is normalized by multiplying it by the same scale factor for all the m/z ratios such that it does not exceed the peak intensities on the measured mass spectrum. The quantitation ion m/z peak intensity on the normalized standard mass spectrum is then examined, and if this intensity exceeds a preset threshold and the confirmation ion ratio determined based on the measured mass spectrum obtained for the target component is outside a reference range, then that target component is taken as a narrowed result candidate.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile