The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Apr. 16, 2015
Applicant:

Los Alamos National Security, Llc, Los Alamos, NM (US);

Inventors:

Eric B. Flynn, Santa Fe, NM (US);

Charles R. Farrar, Los Alamos, NM (US);

Gregory James Sylvester Jarmer, Albuquerque, NM (US);

Assignee:

Triad National Security, LLC, Los Alamos, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/46 (2006.01); G01N 29/24 (2006.01); G01N 29/12 (2006.01); G01N 29/265 (2006.01);
U.S. Cl.
CPC ...
G01N 29/46 (2013.01); G01N 29/12 (2013.01); G01N 29/2418 (2013.01); G01N 29/2437 (2013.01); G01N 29/265 (2013.01); G01N 2291/02818 (2013.01); G01N 2291/02827 (2013.01); G01N 2291/02854 (2013.01); G01N 2291/02881 (2013.01);
Abstract

Methods and apparatus are disclosed for analyzing structures by applying a continuous ultrasonic excitation and measuring steady state response of the structures using laser Doppler vibrometery, or other techniques. In one example, a method comprises applying a continuous signal having one or more periodic tones to the structure, generating measurements of wave response to the signal at each of a plurality of inspection points of the structure, and, for each of the periodic tones, estimating wavenumbers for a number of the inspection points of the structure based on the wave response measurements and the frequency of the periodic tones. The estimated wavenumbers can be used to determine properties of the structure, including defects, damage, or variation in thickness.


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