The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 15, 2019

Filed:

Oct. 11, 2017
Applicant:

Tofwerk Ag, Thun, CH;

Inventors:

Marc Gonin, Thun, CH;

Christian Tanner, Olten, CH;

Assignee:

TOFWERK AG, Thun, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); H01J 49/0036 (2013.01); H01J 49/0072 (2013.01);
Abstract

The invention relates to a method and an apparatus for determining a spectrum of a sample comprising one or more constituent parts on the basis of a time the one or more constituent parts require to undergo a physical process or chemical process. The spectrum is determined by dividing the sample by a modulation unit into assays for which the physical process or chemical process is initiated successively, timed according to a modulation pattern which is a function composed of N consecutive modulation functions with N being 2 or larger, by measuring with a detector in N consecutive cycles a time when the constituent parts of the sample have completed the physical process or chemical process, wherein in succession of the cycles, each cycle is assigned to a consecutive one of the modulation functions within the modulation pattern, wherein each cycle is started with an offset in time as compared to a start of the modulation function it is assigned to, wherein for each cycle, the offset is different, wherein the detector provides a detector signal providing information on when what number of constituent parts have completed the physical process or chemical process and wherein the detector signal has a detection time resolution, wherein at least one of the offsets has an absolute value different from zero, different from the detection time resolution and different from multiples of the detection time resolution, and by calculating a correlation of the detector signal and the modulation pattern with a calculation unit.


Find Patent Forward Citations

Loading…