The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 15, 2019
Filed:
Nov. 08, 2017
Mettler-toledo Safeline Ltd., Salford, Manchester, GB;
Daren Butterworth, Manchester, GB;
Andrew Blackburn, Oldham, GB;
Mettler-Toledo Safeline Ltd., Salford-Manchester, GB;
Abstract
A metal detection apparatus () is tested with a test device () having at least one test article (), movable through a detection zone (). The test article is moved through the detection zone along a first transfer axis (ca) and a first input signal is measured. A first threshold (th) is determined, where an amplitude of the first input signal exceeds the first threshold (th). Then, an identical test article is moved through the detection zone along a further transfer axis (ta; . . . ) and a further input signal is measured and a further threshold (th; . . . ) is determined, where an amplitude of the further input signal exceeds the further threshold (th; . . . ). The first or further threshold (th; th; . . . ) is selected in the signal processing path () whenever the test article is moved along the related transfer axis (ca; ta; . . . ).